Keysight Technologies 53200A Series RF/Universal Frequency Counter/Timers Data Sheet
Imagine Your Counter Doing More! Introduction Frequency counters are depended on in R&D and in manufacturing for the fastest, most accurate frequency and time interval measurements. The 53200 Series of RF and universal frequency counter/timers expands on this expectation to provide you with the most information, connectivity and new measurement capabilities, while building on the speed and accuracy you’ve depended on with Keysight Technologies, Inc. time and frequency measurement expertise.
Input Channel Characteristics Input characteristics (nom) 53210A 53220A 53230A Channels Standard (DC - 350 MHz) Ch 1 Ch 1 & Ch 2 Optional (6 or 15 GHz) Ch 2 Ch 3 Standard inputs (nom) Frequency range DC coupled DC (1 mHz) to 350 MHz (2.8 ns to 1000 sec) AC coupled, 50 Ω1 or 1 MΩ 10 Hz - 350 MHz Input Connector Front panel BNC(f). Option 201 adds parallel rear panel BNC(f) inputs2 Input impedance (typ) Selectable 1 MΩ ± 1.5% or 50 Ω ± 1.
Input Channel Characteristics (continued) 53210A 53220A 53230A Optional microwave inputs (nom) Frequency range Option 106 100 MHz - 6 GHz Option 115 300 MHz - 15 GHz Input Connector Front panel precision Type-N(f) Option 203 moves the input connector to a rear panel SMA(f) Input impedance (typ) 50 Ω ± 1.5% (SWR < 2.5) Input coupling AC Continuous wave amplitude range Option 106 Autoranged to +19 dBm max. (2 Vrms) Option 115 Autoranged to +13 dBm max. (1.
Measurement Characteristics 53210A 53220A 53230A Measurement range (nom) Frequency, period (average) measurements Common Channels Ch 1 or optional Ch 2 Digits/s Ch 1, Ch 2 or optional Ch 3 10 digits/s Maximum display Resolution 1 Measurement technique 12 digits/s 12 digits 15 digits 15 digits Reciprocal Reciprocal and resolution enhanced Reciprocal, resolutionenhanced or continuous (gap-free) Signal type Continuous Wave (CW) Level & slope CW and pulse/burst (Option 150) Automatically p
Measurement Characteristics (continued) 53210A 53220A 53230A Time interval A to B, B to A Range9 N/A -1 ns to 100,000 s (nom) -0.5 ns to 100,000 s (min) Range N/A 2 ns to 100,000 s (min) Minimum width N/A 2 ns Minimum edge repetition rate N/A 6 ns Level & slope N/A Auto-level or user selectable Range N/A 0 s to 1000 s Minimum width N/A 2 ns Minimum edge repetition rate N/A 6 ns Level & slope N/A Auto-level or user selectable Range N/A .000001 to .999999 or 0.0001% to 99.
Measurement Characteristics (continued) 53210A 53220A 53230A 6 GHz (Option 106) Pulse/burst frequency and pulse envelope detector (Option 150) 15 GHz (Option 115) 12 Pulse/burst measurements N/A N/A Carrier frequency, carrier period, pulse repetition interval (PRI), pulse repetition frequency (PRF), positive and negative width Pulse/burst width for carrier frequency measurements10 N/A N/A > 200 ns Narrow: < 17 µs Wide: > 13 µs > 400 ns Narrow: < 17 μs Wide: > 13 μs Minimum pulse/burst width f
Gate, Trigger and Timebase Characteristics 53210A 53220A 53230A Gate characteristics (nom) Gate Source Time, external Gate time (step size) 1 Time, external or advanced 1 ms - 1000 s (10 µs) 100 µs - 1000 s (10 µs) 1 µs - 1000 s (1 µs) Advanced: gate start Source N/A Internal or external, Ch 1/Ch 2 (unused standard channel input) Slope N/A Positive or negative Delay time1 N/A 0 s to 10 s in 10 ns steps Delay events (edges) N/A 0 to 10 8 for signals up to 100 MHz N/A Internal or extern
Trigger and Timebase Characteristics (nom) 53210A 53220A 53230A Trigger characteristics (nom) General Trigger source Internal, external, bus, manual Trigger count 1 to 1,000,000 Trigger delay 0 s to 3600 s in 1 µs steps Samples/trigger 1 to 1,000,000 External trigger input (typ) Connector Rear panel BNC(f) Impedance 1 kΩ Level TTL compatible Slope Selectable positive or negative Pulse width > 40 ns min Latency 2 External trigger rate Frequency, period: 1 µs + 3 periods time interval, t
Math, Graphing and Memory Characteristics (nom) 53210A 53220A 53230A Math operations Smoothing (averaging) 1 Selectable 10 (slow), 100 (medium), 1,000 (fast) reading moving average Selectable filter reset .1% /1000 ppm (fast), .03%/300 ppm (medium), .
Speed Characteristics4 (meas) 53210A Measurement/IO timeout (nom) 53220A 53230A no timeout or 10 ms to 2000 s, in 1 ms steps Auto-level speed Slow mode (50 Hz): 350 ms (typ) Fast mode (10 kHz): 10 ms (typ) Configure-change speed Frequency, Period, Range, Level: 50 ms (typ) Single measurement throughput5: readings/s (time to take single measurement and transfer from volatile reading memory over I/O bus) Typical (Avg.
Speed Characteristics4 (meas) (continued) 53210A 53220A 53230A N/A 1,000,000 Maximum measurement speed to internal non-volatile memory 6: (readings/s) Timestamp Frequency, period, totalize Frequency ratio N/A 75,000 300 Time interval, rise/fall, width, burst width N/A Duty cycle N/A Phase N/A PRI, PRF N/A 44,000 1000 90,000 48,000 37,000 N/A 75,000 Transfer from memory to PC via: LAN (sockets) 600,000 readings/sec LAN (VXI-11) 150,000 readings/sec USB 800,000 readings/sec GPIB 22
General Characteristics (nom) 53210A 53220A Warm-up time Display User interface and help languages 53230A 45-minutes 4.3" Color TFT WQVGA (480 x 272), LED backlight English, German, French, Japanese, Simplified Chinese, Korean USB flash drive FAT, FAT32 Programming language SCPI 532xx Series and 53131A/53132A/53181A Series compatibility mode Programming interface LXI-C 1.3 USB 2.0 device port GPIB interface 10/ 100/ 1000 LAN (LAN Sockets and VXI-11 protocol) USB 2.
General Characteristics (nom) (continued) 53210A 53220A 53230A Battery (Option 300) Technology Internal lithium ion battery with integrated smart battery monitor & charger Use for maintaining timebase accuracy or environments with unstable AC power Operating temperature limits 0 to 55 °C. Battery will only charge under 35 °C. Instrument running on battery power above 50 °C will turn off to minimize battery capacity degradation. Storage temperature limits -10 °C to 60 °C.
Timebase Timebase Uncertainty = ( Aging + Temperature + Calibration Uncertainty ) Standard TCXO Timebase Option 010 Ultra-High Stability OCXO Aging 1 (spec) 24-hour, TCAL ±1 °C ± 0.3 ppb (typ) 30-day, TCAL ±5 °C ± 0.2 ppm (typ) ± 10 ppb 1-year, TCAL ±5 °C ± 1 ppm ± 50 ppb 2-year, TCAL ±5 °C ± 0.5 ppm ± 25 ppb ± 1 ppm ± 5 ppb Initial factory calibration (typ) ± 0.5 ppm ± 50 ppb Settability error ± 0.1 ppb ± 0.01 ppb 5-min.
Accuracy Specifications Definitions Random Uncertainty The RSS of all random or Type-A measurement errors expressed as the total RMS or 1-σ measurement uncertainty. Random uncertainty will reduce as 1/√N when averaging N measurement results for up to a maximum of approximately 13-digits or 100 fs. Systematic Uncertainty The 95% confidence residual constant or Type-B measurement uncertainty relative to an external calibration reference.
Accuracy Specifications (continued) Systematic Uncertainty Timebase Uncertainty 2 If RE > 1: 200 ps / (RE * gate) If RE = 1: 500 ps / gate 200 ps RE * gate ● Pulse/Burst Carrier Frequency 15 (Narrow Mode) (parts error) 100 ps Burst Width 200 ps Burst Width Pulse/Burst Carrier Frequency 16 (Wide Mode) (parts error) 40 ps RE * Burst Width 100 ps RE * Burst Width ● 200 ps RE * gate ● Measurement Function 1- σ Random Uncertainty 6 GHz (Option 106): Optional Microwave Channel Opt 150 - Pulse/Bur
Accuracy Specifications (continued) 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. 12. 13. 14. 15. 16. 17. Apply the appropriate errors detailed for each measuring function. Use Timebase Uncertainty in Basic Accuracy calculations only for Measurement Functions that show the ● symbol in the Timebase Uncertainty column. Assumes Gaussian noise distribution and non-synchronous gate, non-gaussian noise will effect Systematic Error.
Definition of Measurement Error Sources and Terms used in Calculations 53210A 53220A 53230A RE 1 use RE equation use RE equation TSS 100 ps 100 ps 20 ps Skew 100 ps 50 ps Taccuracy 200 ps 100 ps Confidence Level (k) For 99% Confidence use k= 2.5 in accuracy calculations. For 95% Confidence use k= 2.0 in accuracy calculations.
Definition of Measurement Error Sources and Terms used in Calculations (continued) Phase Noise and Allan Deviation The input signal’s jitter spectrum (Phase noise) and low-frequency wander characteristics (Allan variation) will limit the achievable measurement resolution and accuracy. The full accuracy and resolution of the counter can only be achieved when using a high-quality input signal source or by externally filtering the input signal to reduce these errors.
Ordering Information Model numbers 53210A 350 MHz, 10-digits/s RF Frequency Counter 53220A 350 MHz, 12 digits/s, 100 ps Universal Frequency Counter/Timer 53230A 350 MHz, 12-digits/s, 20 ps Universal Frequency Counter/Timer All models include: –– Certificate of Calibration and 3-year standard warranty –– IEC Power Cord, USB cable –– CD including: Programming Examples, Programmer's Reference Help File, User's Guide, Quick Start Tutorial, Service Guide –– Keysight IO Library CD Available options Option 010 U
Appendix A - Worked Example Basic Accuracy Calculation for Frequency Measurement Parameter assumptions: –– 53220A –– 95% confidence –– 100 MHz signal, 1 sec gate –– AUTO frequency mode –– Level: 5 V input signal amplitude –– TCXO standard timebase for unit plugged in for 30 days –– Assume operating temperature is within TCAL ± 5 °C –– Instrument has been re-calibrated so Factory Calibration Uncertainty term is not required.
Definitions The following definitions apply to the specifications and characteristics described throughout. Specification (spec) The warranted performance of a calibrated instrument that has been stored for a minimum of 2½ hours within the operating temperature range of 0 °C - 55 °C and after a 45-minute warm up period. Automated calibration (*CAL?) performed within ±5 °C before measurement. All specifications were created in compliance with ISO-17025 methods.
| Keysight | 53200A Series RF/Universal Frequency Counter/Timers - Data Sheet myKeysight www.keysight.com/find/mykeysight A personalized view into the information most relevant to you. www.axiestandard.org AdvancedTCA® Extensions for Instrumentation and Test (AXIe) is an open standard that extends the AdvancedTCA for general purpose and semiconductor test. Keysight is a founding member of the AXIe consortium.
