Specifications
Index
165
Symbols
+5 VDC supply
, 156
Numerics
0 V user threshold
, 46
A
accessories
, 10
acquisition, 155, 157
acquisition RAM
, 155
analyzer
connect
, 42, 53, 71, 102, 110
set up
, 41, 48, 67, 84, 88, 99, 106
assemblies
exchange
, 148
return
, 145
B
block-level theory
, 154
C
cable
replace probe
, 144
test
, 133
calibrating
see also testing performance
calibration
, 125–126
strategy, 126
test
, 161
characteristics
, 12
environmental, 12
chip registers
, 161
circuit board
replace
, 142
clean module
, 29
clock and data threshold
, 156
comparators, 155, 161
configure
multi-card module
, 20
one-card module, 18
CPLD register
, 158
CPU interface
, 156
D
data threshold
, 156
E
ECL threshold
, 43
environment
characteristics
, 12
operating
, 16
equipment
set up
, 38, 40, 48, 66, 83, 98, 105
test
, 13, 32
exchange assemblies
, 148
exit test system
, 132
F
features
, 2
flowcharts, 128
FPGA
load test
, 158
register test, 158
G
general information
, 9
global arm lines
, 161
I
install module
, 26
instrument warm-up
, 32
inter-chip resource bus
, 161
inter-module flag bits, 161
L
local arm lines
, 161
M
mainframe
, 10
operating system, 128
prepare
, 17
memory
address bus test
, 159
analyzer bus SU/H measure
, 160
analyzer chip bus test
, 160
data bus test, 158
DMA unload test
, 159
HW assisted cell test
, 159
sleep mode test, 159
unload modes test
, 159
module
clean
, 29
inspect
, 16
install
, 26
remove, 140
replace
, 143
test
, 28
multi-card module, 20
configure
, 20
test
, 32, 105
multiple-clock, multiple-edge, state
acquisition
, 66–82
O
one-card module
configure
, 18
test
, 32
operating
environment
, 16
system, 10, 128
P
parts
ordering, 148
replaceable, 149
performance test record
, 121
power
requirements
, 16
system
, 28
test
, 33
test auxiliary, 138
preparing for use
, 15–29
probing
, 154
R
replace
circuit board
, 142
module
, 143
probe cable, 144
replaceable parts
, 147–151
replacing assemblies
, 139–146
return assemblies, 145
S
self-test
, 33, 34, 131
description
, 158
setup/hold, 58, 76, 93, 115
single-clock, multiple-edge, state
acquisition
, 83–97
single-clock, single-edge, state
acquisition
, 48–65
specifications
, 11
storage, 16
system
backplane clock
, 160
operating, 10, 128
test
, 132
turn on
, 28