Specifications

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Chapter 8: Theory of Operation
Zoom Chip Select Test. The Zoom Chip Select Test verifies that each of the
2GHz TimingZoom memory ICs are individually selectable for data upload. Test
data is acquired and stored in the TimingZoom FISO memory. The test data is
then uploaded from each FISO memory IC and compared with known good data.
Passing the Zoom Chip Select Test implies that each TimingZoom memory IC is
individually addressable to upload TimingZoom data.