Specifications
105
Chapter 3: Testing Performance
To Test the Multi-Card Module
To Test the Multi-Card Module
The multi-card test is only required for configured multi-card modules.
Performing the test verifies the performance of the following specifications:
• Minimum master to master clock time
• Maximum state acquisition speed
•Setup/Hold time
Multi-card modules that were changed to one-card modules for the previous
performance tests need to be reconfigured as a multi-card module for this test.
This test checks a combination of data channels using a single-edge clock at one
selected setup/hold time.
Equipment Required
Set up the equipment
If you have not already done so, do the procedure “To Set up the Test Equipment
and the Analyzer” on page 38. Ensure that the pulse generator and oscilloscope
are set up according to the tables in that section.
(TXLSPHQW &ULWLFDO6SHFLILFDWLRQV
5HFRPPHQGHG+3
$JLOHQW0RGHO3DUW
3XOVH*HQHUDWRU 0K]QVSXOVHZLGWKSVULVHWLPH $RSWLRQ
'LJLWL]LQJ2VFLOORVFRSH ≥*+]EDQGZLGWKSVULVHWLPH $Z$
$GDSWHU 60$P%1&I
60$&RD[&DEOH4W\
&RXSOHU4W\ %1&PP
%1&7HVW&RQQHFWRU[4W\