Technical data

607 Rundown too noisy This test checks the gain repeatability between
the integrating
ADC and the U500 onchip ADC. The gain test (606), is
performed eight times. Gain noise must be less than
±64 lsb’s of the
U500 onchip ADC.
608 Serial configuration readback failed This test re-sends the last
5 byte serial configuration data for the measurement sections. The data
is then clocked back into
U501 and compared against the original 5 bytes
sent. A failure occurs if the data do not match.
609 DC gain x1 failed This test configures for the 10 V dc range. The dc
amplifier gain is set to x1. The measure customer (
MC) input is selected
to the internal
TSENSE source which produces 0.6 volts. A 20 ms ADC
measurement is performed and checked against a limit of 0.6 V ± 0.3 V.
610 DC gain x10 failed This test configures for the 1 V dc range. The
dc amplifier gain is set to x10. The measure customer (
MC) input is
selected to the internal
TSENSE source which produces 0.6 volts. A 20 ms
ADC measurement is performed and checked against a limit of 0.6 V ± 0.3 V.
611 DC gain x100 failed This test configures for the 100 mV dc range. The
dc amplifier gain is set to x100. The measure customer (
MC) input is
selected to the internal
TSENSE source which produces 0.6 volts. A 20 ms
ADC measurement is performed and checked for a +overload response.
612 Ohms 500 nA source failed This test configures to the 10 V dc range
with the internal 10 M 100:1 divider
U102A connected across the input.
The 500 nA ohms current source is connected to produce a nominal 5 V
signal. A 20 ms ADC measurement is performed and the result is
checked against a limit of 5 V
± 1 V.
613 Ohms 5 uA source failed This test configures to the 10 V dc range
with the internal 10 M 100:1 divider
U102A connected across the input.
The 5
µA ohms current source is connected. The compliance limit of the
current source is measured. A 20 ms
ADC measurement is performed
and the result is checked against a limit of 7.5 V
± 3 V.
614 DC 1000 V zero failed This test configures to the 1000 V dc range
with no input applied. A 20 ms
ADC measurement is performed and the
result is checked against a limit of 0 V
± 5 mV.
Chapter 6 Service
Self-Test Procedures
122