Specifications

14 Release Notes
Device Test Library √ √ √ √ √
BT-Basic Test Language
√ √ √ √ √
Setup Test Editor
√ √ √ √ √
Analog Test Language
√ √ √ √ √
Vector Control Language
√ √ √ √ √
Pattern Capture Format
√ √ √ √ √
Digital In-circuit Test
√ √ √ √ √
Integrated Digital In-circuit and
Analog Functional Test Language
√ √ √ √ √
IPG-II Program Generator
√ √ √ √ √
Multiple Board Versions
√ √ √ √ √
Dual-Well Shared Wiring
√ √ √ √ √
Short-wire Fixture Technology
√ √ √ √ √
Board Test Grader
√ √ √ √ √
Datalogging
√ √ √ √ √
Pushbutton Q-STATS
√ √ √ √ √
CAMCAD No longer supported.
Advanced Probe Spacing
× * √ √ √ √ * Available only on 05.30 (UNIX)
Automatic 6 Wire Analog ICT Tests
√ √ √ √ √
Automatic Digital Test Generation
√ √ √ √ √
Safeguard ICT Analysis
√ √ √ √ √
Quick Report
√ √ √ √ √
ScanWorks
× √ * √ √ √ * Works only on 05.21 or later
System Configuration and Hardware
Diagnostics
√ √ √ √ √
Medalist Repair Tool
√ √ √ √ √
RS232 Control
√ √ √ √ √
IEEE 488 Instrumentation
√ √ √ * √ * √ ** Not tested
Table 7 Compatibility matrix
Agilent 3070
(UNIX
®
)
Agilent
Medalist 3070
(Windows)
Agilent
Medalist i5000
Agilent
Medalist i3070
UnMux
Agilent
Medalist i3070
Mux
Remarks