User`s guide

Index-6
Index
M
magnitude
measuring
, 1-7
measuring response
, 1-7
maintaining testport output
power during sweep retrace
,
5-7
maintenance
, 8-2
making a basic measurement
, 1-4
choosing measurement
parameters
, 1-4
connecting required test
equipment
, 1-4
connecting the device under
test
, 1-4
error-correction
, 1-5
frequency range, setting
, 1-5
measurement, setting
, 1-5
measuring the device under
test
, 1-5
outputting measurement
results
, 1-6
source power, setting
, 1-5
making non-coaxial
measurements
, 6-49
fixtures
, 6-49
making reflection response
measurements
, 3-9
making transmission response
measurements
, 3-5
manual mode
, 7-9
manual sweep time mode
, 7-11
margin
ripple test value
, 1-89, 1-91
markers
, 1-24
calculating statistics of
measurement data
, 1-42
continuous
, 1-24
coupling display markers
, 1-31
CW frequency, setting
, 1-38
delta markers
, 1-28
discrete
, 1-24
display markers
activating
, 1-25
fixed marker
activating
, 1-29
moving marker information off
of the grids
, 1-26
polar format markers
, 1-32
setting measurement
parameters
, 1-34
smith chart markers
, 1-33
specific amplitude, searching
for
, 1-39
uncoupling display markers
,
1-31
masking
, 3-26
matched adapters
, 6-45
maximum amplitude, searching
for
, 1-39
maximum and minimum
, 1-94
maximum bandwidth
, 1-94
measurement
accuracy, increasing
, 5-4
calibration, power meter
, 6-33
fault location using low pass
,
3-17
high dynamic range
, 2-23
isolation example
, 2-44
non-coaxial
, 6-49
plotting to a disk
, 4-13
printing or plotting results
, 4-3
reflection response
, 3-9
results, outputting
, 1-6
results, saving
, 4-39
results, saving graphically
, 4-45
setting
, 1-5
time domain
, 3-3
transmission measurements in
time domain low pass
, 3-19
transmission response
, 3-5
measurement calibration
, 7-37
accuracy enhancement
, 7-37,
7-52
characterizing microwave
systematic errors
, 7-41
measurement errors
, 7-38
measurement considerations
, 2-4
eliminating unwanted mixing
and leakage signals
, 2-6
frequencyoffsetmodeoperation
,
2-10
how RF and IF are defined
, 2-7
internal and externalR channel
inputs
, 2-10
LO frequency accuracy and
stability
, 2-10
minimizing source and load
mismatches
, 2-4
power meter calibration
, 2-12
reducing the effect of spurious
responses
, 2-5
measurement data
, 1-20
dividing by the memory trace
,
1-20
viewing
, 1-20
measurement data trace
, 1-20
subtracting memory trace
, 1-20
measurement error
crosstalk
, 7-40
frequency response
, 7-40
isolation
, 7-40
load match
, 7-39
measurement errors
directivity
, 7-38
source match
, 7-39
measurement parameters
, 1-69,
6-4
center frequency, setting
, 1-35
choosing
, 1-4
display reference value, setting
,
1-37
electrical delay, setting
, 1-38
for IF range
, 2-20
frequency span, setting
, 1-36
lower stopband parameters
,
1-70
markers, setting with
, 1-34
passband parameters
, 1-70
start frequency, setting
, 1-34
stop frequency, setting
, 1-35
upper stopband parameters
,
1-70
measurements
basic
, 1-4
high power
, 1-60, 1-66
phase or group delay
, 2-34
measuring
device under test
, 1-5
gain and reverse isolation
simultaneously
, 1-58
insertion phase response
, 1-7,
1-8
separate transmission paths
through the test device
using low pass impulse
mode
, 3-20
small signal transient response
using low pass step
, 3-19
measuring amplifiers
, 1-53
high power measurements
, 1-66
high power measurements
making
, 1-60
measuring gain and reverse
isolation simultaneously
,
1-58
measuring gain compression
,
1-54
measuring electrical length
, 1-43
measuring gain compression
, 1-54
linear sweep
, 1-56
using linear sweep
, 1-56
measuring magnitude
, 1-7
magnitude response
, 1-7
measuringphasedistortion
, 1-43,
1-46
deviation from linear phase
,
1-46
group delay
, 1-47
memory math functions
, 1-19
memory trace
, 1-19, 1-20