Operating instructions

LOCAL OPERATION
3-68
Incremental adjustment keys
General
This section provides information on the use of the incremental adjustment keys. Other sections
of this chapter have specific references to these keys; this section gives general information.
The incremental adjustment keys are located under the variable control, with one pair designated
FREQ, [×] and [Ø], the other pair designated LEVEL, [×] and [Ø]. Each pair can be assigned to
a selected parameter within a test mode, which then allows that parameter to be adjusted in steps.
Note that the FREQ [×] and [Ø] keys, and the LEVEL [×] and [Ø] keys, do not have to be
assigned to the same generator.
The parameters that can be selected are:-
Parameter Test mode
Tx frequency Tx test mode
AF generator 1 frequency Tx test mode
AF generator 2 frequency Tx test mode
AF generator 1 level Tx test mode
AF generator 2 level Tx test mode
RF generator frequency † Rx test mode
RF generator level Rx test mode
Modulation generator 1 frequency Rx test mode
Modulation generator 2 frequency Rx test mode
Modulation generator 1 level Rx test mode
Modulation generator 2 level Rx test mode
AF generator 1 frequency AF test mode
AF generator 2 frequency AF test mode
AF generator 1 level AF test mode
AF generator 2 level AF test mode
RF center frequency Spec ana.
RF frequency span ‡ Spec ana.
RF level ‡ ‡ Spec ana.
† The RF generator can be made to step up or down through each channel of a mobile radio system
type, by setting the ∆ frequency to the channel spacing frequency.
‡ The SPEC ANA mode SPAN adjustment using the FREQ
[×] and [Ø] keys, sets the span to
predetermined values. These are not adjustable by the user. See Setting up; SPAN on page 3-56.
‡ ‡ The SPEC ANA mode RF LEVEL adjustment using the
LEVEL [×] and [Ø] keys, changes the
RF reference level in steps of 1 display division . This can be either 2 dB/div or 10 dB/div, dependent
on the value of dB/div set in the SPEC ANA mode.