Specifications

SATA-IO Confidential 54
o Vtest = min(DH, DM, VtestAPP) – 1.5Gb/s [TSG-01b], 3 Gb/s [TSG-01h]
• Note that gathering a minimum result from either of the options above is acceptable. It is not required to
report a result for both.
• Note that the pu/pl measurements outlined in the specification are to be taken, but the results are informative.
There is not verification of maximum limit values for this measurement.
Table 5 – Diff Output voltage pu/pl test name matrix
Pattern
Interface Rate
1.5 Gb/s
3 Gb/s
MFTP – pu
TSG-01c
TSG-01i
MFTP – pl
TSG-01d
TSG-01j
LFTP – pu
TSG-01e
TSG-01k
LFTP - pl
TSG-01f
TSG-01l
• V
diffTX
(min) measured to be (for products running at 1.5Gb/s and 3Gb/s):
Pass/Fail Criteria
o Minimum : VTest at least 400 mVppd
2.14.2. TSG-02 : Rise/Fall Time
2.14.2.1. Device/Host Expected Behavior
See section 7.2.2.3.3 of Serial ATA Revision 2.6.
• See section 7.4.3 of Serial ATA Revision 2.6.
Measurement Requirements
• For products which support 3Gb/s, this requirement must be tested at both interface rates (1.5Gb/s and
3Gb/s).
• There are several different patterns defined within the specification and are intended to be used to verify this
requirement. In order to ensure efficient test time of products within the Interoperability Testing, testing of this
requirement will be limited to the High Frequency Test Pattern (HFTP) as defined in the SATA Revision 2.6
specification.
Table 6 – TX Rise/Fall Test Name matrix
Pattern
Interface Rate
1.5 Gb/s
3 Gb/s
HFTP rise
TSG-02a
TSG-02c
HFTP fall
TSG-02b
TSG-02d
• t
20-80TX
measured per the Max values in Table 6
Pass/Fail Criteria
• Note: Failures at minimum rate have not been shown to affect interoperability and will not be included in
determining pass/fail for Interop testing