Specifications

Reference Guide
4-65
System Configuration and Operation Testing Voice Cross-Connects
4.20 Testing Voice Cross-Connects
Voice and data circuits differ in the way the test function is accessed. While you can set up test
patterns on data circuits on the cross-connect screen from the System Main Screen, you must
use a subscreen of the WAN Cross-Connect Card Screen for circuit testing. Figure 4-40 shows
the error message that appears when you attempt to test voice circuits from the CPU
Cross-Connect Screen.
Figure 4-40. Typical Message on a CPU Cross-Connect Screen
Figure 4-41 shows the WAN Cross-Connect Screen for the voice circuit used in this example.
Place the cursor over the selected circuit and press the "
t
" key to bring up the Test Screen
shown in Figure 4-42. This screen now splits the circuit into two parts, with the location acting
as the midpoint. The first column of test parameters will apply to that portion of the circuit on
port w2-1, time slot 13. The second column of test parameters will apply to that portion of the
circuit on port w2-2, time slot 13.
Table 4-6 lists the test parameters and their available and default values.
Node_1 | C1 CPU XCON Rev A0-0 Ser 00101 | 12-31-99 14:33
page: 1 of 1
CIRCUIT ID W/U TS/BW TEST W/U TS/BW TEST TYPE TC CNV
SF01-HSTN4C w3-1 02*64 off w2-2 02*64 off v&s e&m p&s
MIFL42A-SF01 w2-1 01*64 off w3-1 01*64 off d n/a n/a
NY66-WDC18a w2-1 01*64 off w2-2 01*64 off v&s e&m p&s
SF01-HSTN4C w3-1 02*64 off w2-2 02*64 off v&s e&m p&s
Channel test is available from WAN XCON screen. Press any key to continue .
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