Datasheet

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10. Reliability Test Conditions And Methods
NO. TEST ITEMS TEST CONDITION
INSPECTION AFTER
TEST
High Temperature
Storage
80±2×200Hours
Low Temperature
Storage
-30±2×200Hours
High Temperature
Operating
70±2×120Hours
Low Temperature
Operating
-20±2×120Hours
Temperature
Cycle(Storage)
-20 25 70
(30min) (5min) (30min)
1cycle
Total 10cycle
Damp Proof
Test (Storage)
50±5×90%RH×120Hours
Vibration Test
Frequency:10Hz~55Hz~10Hz
Amplitude:1.5M
X,Y,Z direction for total 3hours
(Packing Condition)
Drooping Test
Drop to the ground from 1M height
one time
every side of carton.
(Packing Condition)
ESD Test
Voltage:±8KV,R:330,C:150PF,Air
Mode,10times
Inspection after 2~4hours
storage at room
temperature,the samples
should be free from
defects:
1,Air bublle in the LCD.
2,Sealleak.
3,Non-display.
4,Missing segments.
5,Glass crack.
6,Current IDD is twice
higher than initial value.
7,The surface shall be
free from damage.
8,The electric
charateristic
requirements shall be
satisfied.
REMARK:
1,The Test samples should be applied to only one test item.
2,Sample side for each test item is 5~10pcs.
3,For Damp Proof Test,Pure water(Resistance10M)should be used.
4,In case of malfunction defect caused by ESD damage,if it would be recovered to normal
state after resetting,it would be judge as a good part.
5,EL evaluation should be excepted from reliability test with humidity and
temperature:Some defects such as black spot/blemish can happen by natural chemical
reaction with humidity and Fluorescence EL has.
6,Failure Judgment Criterion:Basic Specification Electrical Characteristic,Mechanical
Characteristic,Optical Characteristic.